Error Analyses for Measuring of Laser Interferometer in Precision Positioning

CHENG Weiming; GE Yijun

doi:10.3969/j.issn.1009-444X.2006.04.001

Volume 20 Issue 4

Dec. 2006

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Article Navigation > Journal of Shanghai University of Engineering Science > 2006 > 20(4): 287-290

CHENG Weiming, GE Yijun. Error Analyses for Measuring of Laser Interferometer in Precision Positioning[J]. Journal of Shanghai University of Engineering Science, 2006, 20(4): 287-290. doi: 10.3969/j.issn.1009-444X.2006.04.001

Citation:

CHENG Weiming, GE Yijun. Error Analyses for Measuring of Laser Interferometer in Precision Positioning[J]. Journal of Shanghai University of Engineering Science, 2006, 20(4): 287-290. doi: 10.3969/j.issn.1009-444X.2006.04.001